Dr James Gilchrist

James obtained his PhD in material science and engineering from Imperial College London and MChem from the University of Manchester. For his PhD he studied the structure of organic semi-conductor interfaces and thin films and later he extended his research to metal-organic interfaces as part of a post-doctoral research position with industry. During this time, he worked extensively with transmission electron microscopy and focussed ion beam (FIB) milling.

James later ran the electron microscopy facility at the Research Complex at Harwell before starting at eBIC, where he now runs the cryoFIB user program and contributes to the Krios user program.