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Transmission Electron Microscope (TEM): JEM-2100 LaB6
RCaH provide a Transmission Electron Microscope (TEM) for research use.
The JEM-2100 electron microscope has been designed for use in fields including materials, nanoelectronics, and biological sciences.
The JEM-2100 features a high-stability goniometer stage specifically tuned for high tilt tomographic applications. Users may select from a variety of illumination conditions, ranging from full convergent beam to parallel illumination. The incorporation of an objective mini lens means that Lorentz microscopy is a standard feature of this microscope.
The equipment at the research complex provides:
- In-gap (for delicate samples) Objective Apertures
- Single Tilt Sample Holder with Quick Exchange Tips plus Tomography tip
- Double tilt sample holder
- Cryo specimen holder for imaging frozen unstained samples.
For more information from the manufacturer, including a more detailed product specification, see the product page on the JEOL website.
